Estimation of ultrasonic beam skewing in thick austenitic stainless steel weldments. A comparative study of pratical and theoretical observations = Evaluation de la déviation du faisceau lors du contrôle par ultrasons de soudures en acier austénitique de forte épaisseur. Etude comparative des observations théoriques et expérimentalesBARAT, P; RAJ, B; SUBRAMANIAN, C. V et al.Nondestructive testing. 11th world conference. 1985, pp 1294-1299Conference Paper

Etude du soudage par faisceau d'électrons de grande puissance. I. Caractéristiques de la fusion = A study on high power electron beam welding. I. Fusion characteristicsKIHARA, H; KANATANI, F; MATSUI, S et al.Souder (Paris). 1984, Vol 38, Num 11-12, pp 423-429, issn 0246-1900Article

Quasi-tandem electron beam welding = Soudage par faisceau d'électrons «quasi-tandem»HALAS, A; SMARDZ, S.Soudage et fusion par faisceau d'électrons et laser. 3ème Colloque international. 1983, pp 603-609Conference Paper

Three-dimensional electron-beam deflection and missed joint in welding dissimilar metalsWEI, P. S; CHUNG, F. K.Journal of heat transfer. 1997, Vol 119, Num 4, pp 832-839, issn 0022-1481Article

A method to investigate the temporal spectral response of microresonators affected by optical read-out techniquesRADZIO, B; KEHRBUSCH, J; ILIN, E. A et al.Microelectronic engineering. 2011, Vol 88, Num 8, pp 2352-2354, issn 0167-9317, 3 p.Conference Paper

Simultaneous monitoring of ablative shocks in air by high-speed cineholography and multiple-pass beam deflection probeDIACI, J; HURLEY, D; WAGNER, J. W et al.Applied surface science. 1996, Vol 96-98, pp 154-158, issn 0169-4332Conference Paper

Thermal diffusivity of lead-free solders measured by photothermal beam deflection. Effect of the surrounding mediaPRIOR, P; GÖREN, A; MACEDO, F et al.Journal de physique. IV. 2005, Vol 125, pp 265-268, issn 1155-4339, 4 p.Conference Paper

Ergebnisse eines Ringversuchs zur Bestimmung magnetischer Streufelder in Elektronenstrahlmikroanalysatoren = Results of a cooperative test for the determination of magnetic stry fields in electron beam microanalyzersPRIES, H.Archiv für das Eisenhuttenwesen. 1984, Vol 55, Num 2, pp 81-84, issn 0003-8962Article

High power electron beam welding of thick steel plates. Method for eliminating beam deflection caused by residual magnetism = Etude du soudage par faisceau d'électrons à forte puissance. Développement d'une méthode permettant d'éliminer la déflexion du faisceau due au magnétisme rémanent des tôles de forte épaisseurKIHARA, H; MINEHISA, S; SAKABATA, N et al.Welding in the world. 1984, Vol 22, Num 5/6, pp 126-135, issn 0043-2288Article

Soudage par faisceau d'électrons des échangeurs de chaleur = The electron beam welding of heat exchangersCHERGOV, I. V; JARINOV, V. I; MININ, V. A et al.Soudage et fusion par faisceau d'électrons et laser. 3ème Colloque international. 1983, pp 453-464Conference Paper

Precision assembly of a miniaturized wire deflector for electron-beam lithographyRISSE, Stefan; DAMM, Christoph; DÖRING, Hans-Joachim et al.Microelectronic engineering. 2012, Vol 97, pp 100-104, issn 0167-9317, 5 p.Article

Studies of copper patina by photothermal beam deflectionJANSSEN, S; HOFMANN, G. R; FAUBEL, W et al.Fresenius' journal of analytical chemistry. 1998, Vol 360, Num 7-8, pp 788-791, issn 0937-0633Conference Paper

Measurement of energy conversion efficiency during laser ablation by a multiple laser beam deflection probeDIACI, J; MOZINA, J.Ultrasonics. 1996, Vol 34, Num 2-5, pp 523-525, issn 0041-624XConference Paper

Thermische Oberflaechenmodifikation metallischer Bauteile mit Elektronenstrahlen = Thermal surface modification of metal parts by electron beamsSCHILLER, S; PANZER, S.Metall (Berlin, West). 1985, Vol 39, Num 3, pp 227-232, issn 0026-0746Article

Methods of determination of the deflection of the electron beam in welding magnetised componentsDRAGUNOV, V. K; GONCHAROV, A. L.Welding international. 2003, Vol 17, Num 2, pp 128-134, issn 0950-7116, 7 p.Article

Size selection by cluster deflection in an electric fieldXENOULIS, A. C; TSOURIS, P; DOUKELLIS, G et al.Nanostructured materials. 1997, Vol 8, Num 7, pp 771-784, issn 0965-9773Article

Mirror electron microscopy (MEM): Work function and imaging of an electron beam biased junction of silicon(100) = Spiegelelektronenmikroskopie (MEM): Austrittsarbeit und Abbildung eines Elektronenstrahls am Gitterpunkt einer Silizium(100)-FlaecheDUPUY, J.C; SIBAI, A; VILOTITCH, B et al.Surface science. 1984, Vol 147, Num 1, pp 191-202, issn 0039-6028Article